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Study of a Single-Photon Avalanche Diode Models:

, In: 2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS),
Dhouib, Hatem ; Neifar, Amel ; Bouzid, Abdessattar. - p. 1-4 , 2020
Link: https://doi.org/10.1109/DTS48731.2020.9196074