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1 Ergebnisse
1
The Rise of RISC-V from Edge to Cloud:
, In:
2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
,
Su, Charlie Hong-Men
- p. 1-1 , 2020
Link:
https://doi.org/10.1109/VLSI-DAT49148.2020.9196271
RT T1 <cTitle>2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)</cTitle>: T1 <Title>The Rise of RISC-V from Edge to Cloud</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9196271&Exemplar=1&LAN=DE A1 Su, Charlie Hong-Men YR 2020 SN 2472-9124 SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/VLSI-DAT49148.2020.9196271 DO https://doi.org/10.1109/VLSI-DAT49148.2020.9196271 SF ELIB - SuUB Bremen
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