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Fault-Aware ECC Techniques for Reliability Enhancement of F..:

, In: 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT),
Lu, Shyue-Kung ; Tsai, Zeng-Long ; Hsu, Chun-Lung. - p. 1-2 , 2020
Link: https://doi.org/10.1109/VLSI-DAT49148.2020.9196286