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Real-time Error Monitoring System Considering Endurance and..:

, In: 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT),
Kakuta, Yoshiki ; Kinoshita, Reika ; Kinoshita, Hiroshi.. - p. 1-4 , 2020
Link: https://doi.org/10.1109/VLSI-DAT49148.2020.9196379