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1 Ergebnisse
1
Real-time Error Monitoring System Considering Endurance and..:
, In:
2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
,
Kakuta, Yoshiki
;
Kinoshita, Reika
;
Kinoshita, Hiroshi
.. - p. 1-4 , 2020
Link:
https://doi.org/10.1109/VLSI-DAT49148.2020.9196379
RT T1
2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
: T1
Real-time Error Monitoring System Considering Endurance and Data-retention Characteristics of TaOX-based ReRAM Storage with Workloads at Data Centers
UL https://suche.suub.uni-bremen.de/peid=ieee-9196379&Exemplar=1&LAN=DE A1 Kakuta, Yoshiki A1 Kinoshita, Reika A1 Kinoshita, Hiroshi A1 Matsui, Chihiro A1 Takeuchi, Ken YR 2020 SN 2472-9124 K1 Monitoring K1 Bit error rate K1 Error correction K1 Reliability K1 Real-time systems K1 Approximate computing K1 Data centers SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/VLSI-DAT49148.2020.9196379 DO https://doi.org/10.1109/VLSI-DAT49148.2020.9196379 SF ELIB - SuUB Bremen
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