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1 Ergebnisse
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Optimization of Complex Microelectronic Systems at Design R..:
, In:
2020 XXIII International Conference on Soft Computing and Measurements (SCM)
,
Mironov, Sergey E.
;
Andreev, Leonid E.
- p. 80-83 , 2020
Link:
https://doi.org/10.1109/SCM50615.2020.9198801
RT T1 <cTitle>2020 XXIII International Conference on Soft Computing and Measurements (SCM)</cTitle>: T1 <Title>Optimization of Complex Microelectronic Systems at Design Rules Uncertainty by the Management of their Elements Matching</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9198801&Exemplar=1&LAN=DE A1 Mironov, Sergey E. A1 Andreev, Leonid E. YR 2020 K1 Layout K1 Compaction K1 Microelectronics K1 Libraries K1 Standards K1 Pins K1 Adders K1 design rules uncertainty K1 process-tolerant design K1 complex objects of microelectronic systems K1 layout migration K1 layout compaction K1 close-packed design K1 cells matching SP 80 OP 83 LK http://dx.doi.org/https://doi.org/10.1109/SCM50615.2020.9198801 DO https://doi.org/10.1109/SCM50615.2020.9198801 SF ELIB - SuUB Bremen
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