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1 Ergebnisse
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Characterization of Real-world and Accelerated Exposed PV M..:
, In:
2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)
,
Wieser, Raymond
;
Wang, Yu
;
Fairbrother, Andrew
... - p. 1-5 , 2019
Link:
https://doi.org/10.1109/PVSC40753.2019.9198979
RT T1
2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)
: T1
Characterization of Real-world and Accelerated Exposed PV Module Backsheet Degradation
UL https://suche.suub.uni-bremen.de/peid=ieee-9198979&Exemplar=1&LAN=DE A1 Wieser, Raymond A1 Wang, Yu A1 Fairbrother, Andrew A1 Napoli, Sophia A1 Julien, Scott A1 Hauser, Adam W. A1 Ji, Liang A1 Wan, Kai-tai A1 O'Brien, Gregory S. A1 French, Roger H. A1 Kempe, Michael D. A1 Gu, Xiaohong A1 Boyce, Kenneth P. A1 Bruckman, Laura S. YR 2019 K1 Degradation K1 Acceleration K1 Life estimation K1 Photovoltaic systems K1 Rough surfaces K1 Surface roughness K1 backsheet degradation K1 cracking K1 accelerated exposures SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/PVSC40753.2019.9198979 DO https://doi.org/10.1109/PVSC40753.2019.9198979 SF ELIB - SuUB Bremen
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