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Characterizing Microwave Connectors over Temperatures Using..:

, In: 2020 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP),
Gao, Si-Ping ; Cherukhin, Iurii - p. 1-3 , 2020
Link: https://doi.org/10.1109/IMWS-AMP49156.2020.9199657