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1 Ergebnisse
1
Study on the Effect of In-diffusion Annealing on the Resist..:
, In:
2020 21st International Conference on Electronic Packaging Technology (ICEPT)
,
Sui, Songyin
;
Li, Yan
;
Wu, Qiong
... - p. 1-4 , 2020
Link:
https://doi.org/10.1109/ICEPT50128.2020.9202944
RT T1
2020 21st International Conference on Electronic Packaging Technology (ICEPT)
: T1
Study on the Effect of In-diffusion Annealing on the Resistivity of Cd0.9Zn0.1Te
UL https://suche.suub.uni-bremen.de/peid=ieee-9202944&Exemplar=1&LAN=DE A1 Sui, Songyin A1 Li, Yan A1 Wu, Qiong A1 Zhang, Zhiyu A1 Xiong, Xuemei A1 Zhu, Lin YR 2020 K1 Annealing K1 Conductivity K1 Crystals K1 Temperature measurement K1 Temperature K1 Mathematical model K1 Semiconductor device measurement K1 Cd0.9Zn0.1Te K1 resistivity K1 In-diffusion K1 annealing K1 diffusion coefficient SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICEPT50128.2020.9202944 DO https://doi.org/10.1109/ICEPT50128.2020.9202944 SF ELIB - SuUB Bremen
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