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The Energy Spectrum of Field Emission Electrons from 4H Sil..:
, In:
2020 33rd International Vacuum Nanoelectronics Conference (IVNC)
,
Nikiforov, Konstantin
;
Trofimov, Vasiliy
;
Egorov, Nikolay
... - p. 1-2 , 2020
Link:
https://doi.org/10.1109/IVNC49440.2020.9203525
RT T1
2020 33rd International Vacuum Nanoelectronics Conference (IVNC)
: T1
The Energy Spectrum of Field Emission Electrons from 4H Silicon Carbide
UL https://suche.suub.uni-bremen.de/peid=ieee-9203525&Exemplar=1&LAN=DE A1 Nikiforov, Konstantin A1 Trofimov, Vasiliy A1 Egorov, Nikolay A1 Golubkov, Vladimir A1 Ilyin, Vladimir A1 Ivanov, Alexey YR 2020 SN 2380-6311 K1 Silicon carbide K1 Feeds K1 Electron emission K1 Electric potential K1 Spectroscopy K1 Nanoelectronics K1 Current measurement K1 silicon carbide K1 field emission K1 electron emission K1 spectroscopy K1 wide bandgap semiconductors K1 silicon compounds K1 retarding potential SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/IVNC49440.2020.9203525 DO https://doi.org/10.1109/IVNC49440.2020.9203525 SF ELIB - SuUB Bremen
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