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A Study of Read Variability in Backfill Contact Random Acce..:

, In: 2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Chang, Fu-Cheng ; Huang, Yao-Hung ; Lin, Chrong-Jung. - p. 39-40 , 2020
Link: https://doi.org/10.1109/VLSI-TSA48913.2020.9203597