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1 Ergebnisse
1
A Study of Read Variability in Backfill Contact Random Acce..:
, In:
2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
,
Chang, Fu-Cheng
;
Huang, Yao-Hung
;
Lin, Chrong-Jung
. - p. 39-40 , 2020
Link:
https://doi.org/10.1109/VLSI-TSA48913.2020.9203597
RT T1
2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
: T1
A Study of Read Variability in Backfill Contact Random Access Memory
UL https://suche.suub.uni-bremen.de/peid=ieee-9203597&Exemplar=1&LAN=DE A1 Chang, Fu-Cheng A1 Huang, Yao-Hung A1 Lin, Chrong-Jung A1 King, Ya-Chin YR 2020 K1 Resistance K1 Standards K1 Stress K1 Reliability K1 Timing K1 Arrays K1 Nonvolatile memory SP 39 OP 40 LK http://dx.doi.org/https://doi.org/10.1109/VLSI-TSA48913.2020.9203597 DO https://doi.org/10.1109/VLSI-TSA48913.2020.9203597 SF ELIB - SuUB Bremen
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