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Gradual Resistive Switching in Electron Beam Irradiated ReS..:

, In: 2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Li, Sifan ; Li, Bochang ; Feng, Xuewei... - p. 157-158 , 2020
Link: https://doi.org/10.1109/VLSI-TSA48913.2020.9203618