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1 Ergebnisse
1
Comparative experimental study of junctionless and inversio..:
, In:
2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
,
Bosch, D.
;
Colinge, J.P.
;
Lugo, J.
... - p. 126-127 , 2020
Link:
https://doi.org/10.1109/VLSI-TSA48913.2020.9203690
RT T1 <cTitle>2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)</cTitle>: T1 <Title>Comparative experimental study of junctionless and inversion-mode nanowire transistors for analog applications</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9203690&Exemplar=1&LAN=DE A1 Bosch, D. A1 Colinge, J.P. A1 Lugo, J. A1 Tataridou, A. A1 Theodorou, C. A1 Garros, X. A1 Barraud, S. A1 Lacord, J. A1 Sklenard, B. A1 Casse, M. A1 Brunet, L. A1 Batude, P. A1 Fenouillet-Beranger, C. A1 Lattard, D. A1 Cluzel, J. A1 Allain, F. A1 Youcef, R. Nait A1 Hartmann, J.M. A1 Vizioz, C. A1 Audoit, G. A1 Balestra, F. A1 Andrieu, F. YR 2020 K1 Logic gates K1 Doping K1 Silicon-on-insulator K1 Annealing K1 Performance evaluation K1 MOSFET SP 126 OP 127 LK http://dx.doi.org/https://doi.org/10.1109/VLSI-TSA48913.2020.9203690 DO https://doi.org/10.1109/VLSI-TSA48913.2020.9203690 SF ELIB - SuUB Bremen
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