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An IIoT System to Monitor 3D–Printed Artifacts via LoRaWAN ..:

, In: 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA),
Trevisan, Luca ; Vitturi, Stefano ; Tramarin, Federico. - p. 1331-1334 , 2020
Link: https://doi.org/10.1109/ETFA46521.2020.9212019