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Effect of Nanometric Oxides on Dielectric and Mechanical Pr..:

, In: 2020 International Conference on Diagnostics in Electrical Engineering (Diagnostika),
Hornak, Jaroslav ; Kubes, Tomas ; Trnka, Pavel - p. 1-4 , 2020
Link: https://doi.org/10.1109/Diagnostika49114.2020.9214716