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Completely Positive Trace Preserving Methods for the Lindbl..:

, In: 2020 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD),
Riesch, Michael ; Pikl, Alek ; Jirauschek, Christian - p. 109-110 , 2020
Link: https://doi.org/10.1109/NUSOD49422.2020.9217670