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1 Ergebnisse
1
Design of Radiation Hardened RADFET Readout System for Spac..:
, In:
2020 23rd Euromicro Conference on Digital System Design (DSD)
,
Andjelkovic, Marko
;
Simevski, Aleksandar
;
Chen, Junchao
... - p. 484-488 , 2020
Link:
https://doi.org/10.1109/DSD51259.2020.00082
RT T1 <cTitle>2020 23rd Euromicro Conference on Digital System Design (DSD)</cTitle>: T1 <Title>Design of Radiation Hardened RADFET Readout System for Space Applications</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9217874&Exemplar=1&LAN=DE A1 Andjelkovic, Marko A1 Simevski, Aleksandar A1 Chen, Junchao A1 Schrape, Oliver A1 Stamenkovic, Zoran A1 Krstic, Milos A1 Ilic, Stefan A1 Spahic, Luka A1 Kostic, Laza A1 Ristic, Goran A1 Jaksic, Aleksandar A1 Palma, Alberto J. A1 Lallena, Antonio A1 Carvaja, Miguel Angel YR 2020 K1 Current measurement K1 Voltage measurement K1 Threshold voltage K1 Semiconductor device measurement K1 Radiation hardening (electronics) K1 Voltage control K1 Real-time systems K1 RADFET readout K1 radiation hardness K1 self-adaptive multiprocessing system-on-chip (MPSoC) SP 484 OP 488 LK http://dx.doi.org/https://doi.org/10.1109/DSD51259.2020.00082 DO https://doi.org/10.1109/DSD51259.2020.00082 SF ELIB - SuUB Bremen
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