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1 Ergebnisse
1
77 GHz CMOS Built-In Self-Test with 72 dB C/N and less than..:
, In:
2020 IEEE Radio Frequency Integrated Circuits Symposium (RFIC)
,
Kohtani, Masato
;
Murakami, Tomotoshi
;
Utagawa, Yoshiyuki
.. - p. 35-38 , 2020
Link:
https://doi.org/10.1109/RFIC49505.2020.9218410
RT T1
2020 IEEE Radio Frequency Integrated Circuits Symposium (RFIC)
: T1
77 GHz CMOS Built-In Self-Test with 72 dB C/N and less than 1 ppm frequency tolerance for a multi-channel radar application
UL https://suche.suub.uni-bremen.de/peid=ieee-9218410&Exemplar=1&LAN=DE A1 Kohtani, Masato A1 Murakami, Tomotoshi A1 Utagawa, Yoshiyuki A1 Arai, Tomoyuki A1 Yamaura, Shinji YR 2020 SN 2375-0995 K1 Built-in self-test K1 Temperature measurement K1 Mixers K1 Phase locked loops K1 Phase shifters K1 Radar K1 Temperature sensors K1 Millimeter wave radar K1 Design for testability K1 CMOS integrated circuits SP 35 OP 38 LK http://dx.doi.org/https://doi.org/10.1109/RFIC49505.2020.9218410 DO https://doi.org/10.1109/RFIC49505.2020.9218410 SF ELIB - SuUB Bremen
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