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1 Ergebnisse
1
Metrology in eye pressure measurements:
, In:
2020 IEEE Sensors Applications Symposium (SAS)
,
Pavlasek, Peter
;
Rybar, Jan
;
Duris, Stanislav
... - p. 1-6 , 2020
Link:
https://doi.org/10.1109/SAS48726.2020.9220014
RT T1 <cTitle>2020 IEEE Sensors Applications Symposium (SAS)</cTitle>: T1 <Title>Metrology in eye pressure measurements</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9220014&Exemplar=1&LAN=DE A1 Pavlasek, Peter A1 Rybar, Jan A1 Duris, Stanislav A1 Hucko, Branislav A1 Palencar, Jakub A1 Chytil, Miroslav YR 2020 K1 metrology K1 medical applications K1 eye pressure K1 standard K1 non-contact SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/SAS48726.2020.9220014 DO https://doi.org/10.1109/SAS48726.2020.9220014 SF ELIB - SuUB Bremen
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