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A Novel Latch Circuit against Single Event Upset:

, In: 2020 International Conference on Artificial Intelligence and Electromechanical Automation (AIEA),
Bai, Yuxin ; Yu, Shilin ; Ma, Liping... - p. 500-503 , 2020
Link: https://doi.org/10.1109/AIEA51086.2020.00112