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Bayesian Estimations of Reliability on One Type of Missile ..:

, In: 2020 International Conference on Artificial Intelligence and Electromechanical Automation (AIEA),
Hu, Wenlin ; Sun, Chenfeng ; Li, Dongbing - p. 193-196 , 2020
Link: https://doi.org/10.1109/AIEA51086.2020.00048