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Estimation of Test Data Volume for Scan Architectures with ..:

, In: 2020 IEEE International Test Conference in Asia (ITC-Asia),
Tsai, Fong-Jyun ; Ye, Chong-Siao ; Huang, Yu... - p. 130-135 , 2020
Link: https://doi.org/10.1109/ITC-Asia51099.2020.00034