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Diagnosis technique for Clustered Multiple Transition Delay..:

, In: 2020 IEEE International Test Conference in Asia (ITC-Asia),
You, Yan-Shen ; Liu, Chih-Yan ; Wu, Mu-Ting.. - p. 53-58 , 2020
Link: https://doi.org/10.1109/ITC-Asia51099.2020.00021