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1 Ergebnisse
1
The Decision Mechanism Uses the Multiple-Tests Scheme to Im..:
, In:
2020 IEEE International Test Conference in Asia (ITC-Asia)
,
Yeh, Chung-Huang
;
Chen, Jwu E
- p. 88-93 , 2020
Link:
https://doi.org/10.1109/ITC-Asia51099.2020.00027
RT T1 <cTitle>2020 IEEE International Test Conference in Asia (ITC-Asia)</cTitle>: T1 <Title>The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC Testing</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9226565&Exemplar=1&LAN=DE A1 Yeh, Chung-Huang A1 Chen, Jwu E YR 2020 K1 guardband test K1 defect level K1 test quality K1 test specification K1 test errors SP 88 OP 93 LK http://dx.doi.org/https://doi.org/10.1109/ITC-Asia51099.2020.00027 DO https://doi.org/10.1109/ITC-Asia51099.2020.00027 SF ELIB - SuUB Bremen
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