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Path Delay Measurement with Correction for Temperature And ..:

, In: 2020 IEEE International Test Conference in Asia (ITC-Asia),
Miyake, Yousuke ; Kato, Takaaki ; Kajihara, Seiji - p. 112-117 , 2020
Link: https://doi.org/10.1109/ITC-Asia51099.2020.00031