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1 Ergebnisse
1
Test Methodology for Defect-based Bridge Faults:
, In:
2020 IEEE International Test Conference in Asia (ITC-Asia)
,
Hu, Yu-Pang
;
Chang, Shuo-Wen
;
Wu, Kai-Chiang
... - p. 106-111 , 2020
Link:
https://doi.org/10.1109/ITC-Asia51099.2020.00030
RT T1 <cTitle>2020 IEEE International Test Conference in Asia (ITC-Asia)</cTitle>: T1 <Title>Test Methodology for Defect-based Bridge Faults</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9226574&Exemplar=1&LAN=DE A1 Hu, Yu-Pang A1 Chang, Shuo-Wen A1 Wu, Kai-Chiang A1 Wang, Chi Chun A1 Huang, Fu-Sheng A1 Tang, Yi-Lun A1 Chen, Yung-Chen A1 Chen, Ming-Chien A1 Chao, Mango C.-T. YR 2020 SP 106 OP 111 LK http://dx.doi.org/https://doi.org/10.1109/ITC-Asia51099.2020.00030 DO https://doi.org/10.1109/ITC-Asia51099.2020.00030 SF ELIB - SuUB Bremen
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