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1 Ergebnisse
1
tf-Darshan: Understanding Fine-grained I/O Performance in M..:
, In:
2020 IEEE International Conference on Cluster Computing (CLUSTER)
,
Chien, Steven W. D.
;
Podobas, Artur
;
Peng, Ivy B.
. - p. 359-370 , 2020
Link:
https://doi.org/10.1109/CLUSTER49012.2020.00046
RT T1
2020 IEEE International Conference on Cluster Computing (CLUSTER)
: T1
tf-Darshan: Understanding Fine-grained I/O Performance in Machine Learning Workloads
UL https://suche.suub.uni-bremen.de/peid=ieee-9229605&Exemplar=1&LAN=DE A1 Chien, Steven W. D. A1 Podobas, Artur A1 Peng, Ivy B. A1 Markidis, Stefano YR 2020 SN 2168-9253 K1 Training K1 Runtime library K1 Instruments K1 Data visualization K1 Machine learning K1 Tools K1 Optimization K1 Deep-Learning K1 Machine Learning K1 I/O K1 Data pre-processing K1 TensorFlow K1 profiling K1 tracing SP 359 OP 370 LK http://dx.doi.org/https://doi.org/10.1109/CLUSTER49012.2020.00046 DO https://doi.org/10.1109/CLUSTER49012.2020.00046 SF ELIB - SuUB Bremen
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