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Efficient Process-to-Node Mapping Algorithms for Stencil Co..:

, In: 2020 IEEE International Conference on Cluster Computing (CLUSTER),
von Kirchbach, Konrad ; Lehr, Markus ; Hunold, Sascha.. - p. 1-11 , 2020
Link: https://doi.org/10.1109/CLUSTER49012.2020.00011