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1 Ergebnisse
1
Performance Analysis and Scaling Behavior of Ultra-Scaled I..:
, In:
2020 IEEE Region 10 Symposium (TENSYMP)
,
Zeyad, Mohammad
;
Ahmed, S.M. Masum
;
Pramanik, Anup Kumar
... - p. 48-51 , 2020
Link:
https://doi.org/10.1109/TENSYMP50017.2020.9230705
RT T1
2020 IEEE Region 10 Symposium (TENSYMP)
: T1
Performance Analysis and Scaling Behavior of Ultra-Scaled III-V (InAs) HEMTs System with 2-D Tunneling Effects on Leakage Current
UL https://suche.suub.uni-bremen.de/peid=ieee-9230705&Exemplar=1&LAN=DE A1 Zeyad, Mohammad A1 Ahmed, S.M. Masum A1 Pramanik, Anup Kumar A1 Rahman, Md. Mustafizur A1 Maruf, Md. Tanvir Hassan A1 Ghosh, Debashish YR 2020 SN 2642-6102 K1 Logic gates K1 MODFETs K1 HEMTs K1 Two dimensional displays K1 Insulators K1 Substrates K1 Shape K1 Current Leakage K1 GUI K1 HEMT K1 InAs K1 MATLAB K1 OMEN_FET K1 2-D Schrödinger-Poisson SP 48 OP 51 LK http://dx.doi.org/https://doi.org/10.1109/TENSYMP50017.2020.9230705 DO https://doi.org/10.1109/TENSYMP50017.2020.9230705 SF ELIB - SuUB Bremen
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