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Analysis of the Influence of Roughness on the Propagation C..:

, In: 2020 IEEE 29th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS),
Waeytens, Ruben ; Bosman, Dries ; Huynen, Martijn... - p. 1-3 , 2020
Link: https://doi.org/10.1109/EPEPS48591.2020.9231312