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1 Ergebnisse
1
Estimating Per-Unit-Length Resistance Parameter in Emerging..:
, In:
2020 IEEE 29th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)
,
Kumar, Rahul
;
Likith Narayan, S. S.
;
Kumar, Somesh
... - p. 1-3 , 2020
Link:
https://doi.org/10.1109/EPEPS48591.2020.9231495
RT T1 <cTitle>2020 IEEE 29th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)</cTitle>: T1 <Title>Estimating Per-Unit-Length Resistance Parameter in Emerging Copper-Graphene Hybrid Interconnects via Prior Knowledge based Accelerated Neural Networks</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9231495&Exemplar=1&LAN=DE A1 Kumar, Rahul A1 Likith Narayan, S. S. A1 Kumar, Somesh A1 Roy, Sourajeet A1 Kaushik, Brajesh K. A1 Achar, Ramachandra A1 Sharma, Rohit YR 2020 SN 2165-4115 K1 Artificial neural networks (ANN) K1 copper-graphene hybrid interconnects K1 per-unit-length resistance K1 variability analysis K1 training data SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EPEPS48591.2020.9231495 DO https://doi.org/10.1109/EPEPS48591.2020.9231495 SF ELIB - SuUB Bremen
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