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1
Comparison of Medium-Voltage Oscilloscope Probes for Evalua..:
, In:
2020 IEEE Energy Conversion Congress and Exposition (ECCE)
,
New, Christopher D.
;
Lemmon, Andrew N.
;
DeBoi, Brian T.
.. - p. 181-188 , 2020
Link:
https://doi.org/10.1109/ECCE44975.2020.9236357
RT T1
2020 IEEE Energy Conversion Congress and Exposition (ECCE)
: T1
Comparison of Medium-Voltage Oscilloscope Probes for Evaluating Silicon-Carbide Multi-Chip Power Modules
UL https://suche.suub.uni-bremen.de/peid=ieee-9236357&Exemplar=1&LAN=DE A1 New, Christopher D. A1 Lemmon, Andrew N. A1 DeBoi, Brian T. A1 Helton, Jared C. A1 Nelson, Blake W. YR 2020 SN 2329-3748 K1 Probes K1 Voltage measurement K1 Current measurement K1 Oscilloscopes K1 Semiconductor device measurement K1 Silicon carbide K1 Switches K1 time-domain characterization K1 wide bandgap K1 oscilloscope metrology K1 medium-voltage measurements SP 181 OP 188 LK http://dx.doi.org/https://doi.org/10.1109/ECCE44975.2020.9236357 DO https://doi.org/10.1109/ECCE44975.2020.9236357 SF ELIB - SuUB Bremen
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