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A Comparative Reliability Analysis of Boost-Type Three-Phas..:
, In:
2020 XXIX International Scientific Conference Electronics (ET)
,
Papanchev, T.
;
Marinov, A.
;
Bekov, E.
. - p. 1-4 , 2020
Link:
https://doi.org/10.1109/ET50336.2020.9238190
RT T1 <cTitle>2020 XXIX International Scientific Conference Electronics (ET)</cTitle>: T1 <Title>A Comparative Reliability Analysis of Boost-Type Three-Phase PFC Rectifiers</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9238190&Exemplar=1&LAN=DE A1 Papanchev, T. A1 Marinov, A. A1 Bekov, E. A1 Garipova, J. YR 2020 K1 MOSFET K1 Schottky diodes K1 Rectifiers K1 Reliability engineering K1 Topology K1 Integrated circuit reliability K1 Stress K1 onboard equipment K1 PFC K1 reliability K1 three-phase rectifier SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ET50336.2020.9238190 DO https://doi.org/10.1109/ET50336.2020.9238190 SF ELIB - SuUB Bremen
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