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1 Ergebnisse
1
Novel Optimization Method using Machine-learning for Device..:
, In:
2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
,
Kim, Junhyeok
;
Yoo, Jae-Hyun
;
Jung, Jaehyun
... - p. 343-346 , 2020
Link:
https://doi.org/10.23919/SISPAD49475.2020.9241590
RT T1 <cTitle>2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)</cTitle>: T1 <Title>Novel Optimization Method using Machine-learning for Device and Process Competitiveness of BCD Process</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9241590&Exemplar=1&LAN=DE A1 Kim, Junhyeok A1 Yoo, Jae-Hyun A1 Jung, Jaehyun A1 Kim, Kwangtea A1 Bae, Jaehyun A1 Kim, Yoon-suk A1 Kwon, OhKyum A1 Kwon, UiHui A1 Kim, DaeSin YR 2020 SN 1946-1577 K1 Performance evaluation K1 Semiconductor device modeling K1 Process modeling K1 Optimization methods K1 Stability analysis K1 Silicon K1 Semiconductor process modeling K1 BCD process K1 optimization K1 machine-learning K1 LDMOS K1 statistical modelling SP 343 OP 346 LK http://dx.doi.org/https://doi.org/10.23919/SISPAD49475.2020.9241590 DO https://doi.org/10.23919/SISPAD49475.2020.9241590 SF ELIB - SuUB Bremen
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