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1
Enhanced Capabilities of the Nano-Electronic Simulation Sof..:
, In:
2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
,
Medina-Bailon, Cristina
;
Badami, Oves
;
Carrillo-Nunez, Hamilton
... - p. 293-296 , 2020
Link:
https://doi.org/10.23919/SISPAD49475.2020.9241594
RT T1 <cTitle>2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)</cTitle>: T1 <Title>Enhanced Capabilities of the Nano-Electronic Simulation Software (NESS)</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9241594&Exemplar=1&LAN=DE A1 Medina-Bailon, Cristina A1 Badami, Oves A1 Carrillo-Nunez, Hamilton A1 Dutta, Tapas A1 Nagy, Daniel A1 Adamu-Lema, Fikru A1 Georgiev, Vihar P. A1 Asenov, Asen YR 2020 SN 1946-1577 K1 Monte Carlo methods K1 Green products K1 Software K1 Nanoscale devices K1 Semiconductor process modeling K1 Kinetic theory K1 Gate leakage K1 Integrated Simulation Environment K1 Drift-Diffusion K1 Kubo-Greenwood K1 Gate Leakage K1 Kinetic Monte Carlo K1 Non-Equilibrium Green's Function K1 Six band k.p K1 Effective mass K1 Variability SP 293 OP 296 LK http://dx.doi.org/https://doi.org/10.23919/SISPAD49475.2020.9241594 DO https://doi.org/10.23919/SISPAD49475.2020.9241594 SF ELIB - SuUB Bremen
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