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1 Ergebnisse
1
Automatic Device Model Parameter Extractions via Hybrid Int..:
, In:
2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
,
Liu, Cheng-Che
;
Li, Yiming
;
Yang, Ya-Shu
.. - p. 355-358 , 2020
Link:
https://doi.org/10.23919/SISPAD49475.2020.9241613
RT T1 <cTitle>2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)</cTitle>: T1 <Title>Automatic Device Model Parameter Extractions via Hybrid Intelligent Methodology</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9241613&Exemplar=1&LAN=DE A1 Liu, Cheng-Che A1 Li, Yiming A1 Yang, Ya-Shu A1 Chen, Chieh-Yang A1 Chuang, Min-Hui YR 2020 SN 1946-1577 K1 Semiconductor device modeling K1 Semiconductor device measurement K1 Evolutionary computation K1 Semiconductor process modeling K1 Semiconductor diodes K1 Integrated circuit modeling K1 Parameter extraction K1 Automatic model parameter extraction K1 Hybrid intelligent methodology K1 Multiobjective evolutionary algorithms SP 355 OP 358 LK http://dx.doi.org/https://doi.org/10.23919/SISPAD49475.2020.9241613 DO https://doi.org/10.23919/SISPAD49475.2020.9241613 SF ELIB - SuUB Bremen
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