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A technique for phase-detection auto focus under near-infra..:
, In:
2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
,
Kunikiyo, Tatsuya
;
Sato, Hidenori
;
Kamino, Takeshi
... - p. 137-140 , 2020
Link:
https://doi.org/10.23919/SISPAD49475.2020.9241631
RT T1 <cTitle>2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)</cTitle>: T1 <Title>A technique for phase-detection auto focus under near-infrared-ray incidence in a back-side illuminated CMOS image sensor pixel with selectively grown germanium on silicon</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9241631&Exemplar=1&LAN=DE A1 Kunikiyo, Tatsuya A1 Sato, Hidenori A1 Kamino, Takeshi A1 Iizuka, Koji A1 Sonoda, Ken'ichiro A1 Yamashita, Tomohiro YR 2020 SN 1946-1577 K1 Solid modeling K1 Surface waves K1 CMOS image sensors K1 Silicon K1 Semiconductor process modeling K1 Pupils K1 Time-domain analysis SP 137 OP 140 LK http://dx.doi.org/https://doi.org/10.23919/SISPAD49475.2020.9241631 DO https://doi.org/10.23919/SISPAD49475.2020.9241631 SF ELIB - SuUB Bremen
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