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1 Ergebnisse
1
Modeling Assisted Room Temperature Operation of Atomic Prec..:
, In:
2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
,
Gao, Xujiao
;
Tracy, Lisa A.
;
Anderson, Evan M.
... - p. 277-280 , 2020
Link:
https://doi.org/10.23919/SISPAD49475.2020.9241642
RT T1 <cTitle>2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)</cTitle>: T1 <Title>Modeling Assisted Room Temperature Operation of Atomic Precision Advanced Manufacturing Devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9241642&Exemplar=1&LAN=DE A1 Gao, Xujiao A1 Tracy, Lisa A. A1 Anderson, Evan M. A1 Campbell, DeAnna M. A1 Ivie, Jeffrey A. A1 Lu, Tzu-Ming A1 Mamaluy, Denis A1 Schmucker, Scott W. A1 Misra, Shashank YR 2020 SN 1946-1577 K1 Temperature measurement K1 Computational modeling K1 Wires K1 Scattering K1 Semiconductor process modeling K1 Manufacturing K1 Microelectronics K1 atomic precision advanced manufacturing (APAM) K1 room temperature operation K1 current leakage K1 semiclassical TCAD K1 ionized impurity scattering SP 277 OP 280 LK http://dx.doi.org/https://doi.org/10.23919/SISPAD49475.2020.9241642 DO https://doi.org/10.23919/SISPAD49475.2020.9241642 SF ELIB - SuUB Bremen
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