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1
Application of Noise to Avoid Overfitting in TCAD Augmented..:
, In:
2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
,
Raju, Sophia Susan
;
Wang, Boyan
;
Mehta, Kashyap
... - p. 351-354 , 2020
Link:
https://doi.org/10.23919/SISPAD49475.2020.9241654
RT T1 <cTitle>2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)</cTitle>: T1 <Title>Application of Noise to Avoid Overfitting in TCAD Augmented Machine Learning</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9241654&Exemplar=1&LAN=DE A1 Raju, Sophia Susan A1 Wang, Boyan A1 Mehta, Kashyap A1 Xiao, Ming A1 Zhang, Yuhao A1 Wong, Hiu-Yung YR 2020 SN 1946-1577 K1 Temperature measurement K1 Schottky diodes K1 Semiconductor device measurement K1 Machine learning K1 Silicon K1 Semiconductor process modeling K1 P-i-n diodes K1 Gallium Oxide K1 Machine Learning K1 Noise K1 Schottky Barrier Diode K1 TCAD SP 351 OP 354 LK http://dx.doi.org/https://doi.org/10.23919/SISPAD49475.2020.9241654 DO https://doi.org/10.23919/SISPAD49475.2020.9241654 SF ELIB - SuUB Bremen
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