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1 Ergebnisse
1
Automatic Modeling of Logic Device Performance Based on Mac..:
, In:
2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
,
Kim, Seungju
;
Lee, Kwangseok
;
Noh, Hyeon-Kyun
... - p. 47-50 , 2020
Link:
https://doi.org/10.23919/SISPAD49475.2020.9241681
RT T1 <cTitle>2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)</cTitle>: T1 <Title>Automatic Modeling of Logic Device Performance Based on Machine Learning and Explainable AI</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9241681&Exemplar=1&LAN=DE A1 Kim, Seungju A1 Lee, Kwangseok A1 Noh, Hyeon-Kyun A1 Shin, Youngkyu A1 Chang, Kyu-Baik A1 Jeong, Jaehoon A1 Baek, Sangwon A1 Kang, Myunggil A1 Cho, Keunhwi A1 Kim, Dong-Won A1 Kim, Daesin YR 2020 SN 1946-1577 K1 Performance evaluation K1 Semiconductor device modeling K1 Machine learning K1 Predictive models K1 Semiconductor process modeling K1 Standards K1 Logic devices K1 Logic device K1 electrical test K1 machine learning K1 explainable AI K1 SHAP (Shapley Additive explanation) SP 47 OP 50 LK http://dx.doi.org/https://doi.org/10.23919/SISPAD49475.2020.9241681 DO https://doi.org/10.23919/SISPAD49475.2020.9241681 SF ELIB - SuUB Bremen
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