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A First-principles Study on the Strain-induced Localized El..:

, In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Zhang, Qinqiang ; Suzuki, Ken ; Miura, Hideo - p. 379-382 , 2020
Link: https://doi.org/10.23919/SISPAD49475.2020.9241686