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1 Ergebnisse
1
EFT Transient Noise Model and Protection Analysis from Chip..:
, In:
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE
,
Lin, Han-Nien
;
Ho, Tzu-Hao
;
Huang, Yu-Chun
... - p. 1-4 , 2020
Link:
https://doi.org/10.1109/EMCEUROPE48519.2020.9245631
RT T1 <cTitle>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</cTitle>: T1 <Title>EFT Transient Noise Model and Protection Analysis from Chip to System Level on Power Distribution</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9245631&Exemplar=1&LAN=DE A1 Lin, Han-Nien A1 Ho, Tzu-Hao A1 Huang, Yu-Chun A1 Ko, Po-Ning A1 Huang, Jia-Yu A1 Tsai, Yu-Lin A1 Li, Jie-Kuan A1 Hsiao, Huei-Chun A1 Chang, Yen-Tang A1 Su, Chia-Hung A1 Lin, Jeffrey Yen-Ting YR 2020 SN 2325-0364 K1 Transient Noise K1 Immunity K1 EFT Burst K1 EMS SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/EMCEUROPE48519.2020.9245631 DO https://doi.org/10.1109/EMCEUROPE48519.2020.9245631 SF ELIB - SuUB Bremen
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