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1 Ergebnisse
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HCI Degradation of LOCOS-based LDMOS Transistor fabricated ..:
, In:
2020 International Conference on Electrical Engineering (ICEE)
,
Houadef, Ali
;
Djezzar, Boualem
- p. 1-6 , 2020
Link:
https://doi.org/10.1109/ICEE49691.2020.9249844
RT T1 <cTitle>2020 International Conference on Electrical Engineering (ICEE)</cTitle>: T1 <Title>HCI Degradation of LOCOS-based LDMOS Transistor fabricated by 1 μ m CMOS Process</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9249844&Exemplar=1&LAN=DE A1 Houadef, Ali A1 Djezzar, Boualem YR 2020 SN 2150-3923 K1 LDMOS K1 Hot Carrier Injection K1 LOCOS SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ICEE49691.2020.9249844 DO https://doi.org/10.1109/ICEE49691.2020.9249844 SF ELIB - SuUB Bremen
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