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Investigating the Impact of Radiation-Induced Soft Errors o..:

, In: 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Luza, Lucas Matana ; Soderstrom, Daniel ; Tsiligiannis, Georgios... - p. 1-6 , 2020
Link: https://doi.org/10.1109/DFT50435.2020.9250865