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Investigating the Impact of Radiation-Induced Soft Errors o..:
, In:
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
,
Luza, Lucas Matana
;
Soderstrom, Daniel
;
Tsiligiannis, Georgios
... - p. 1-6 , 2020
Link:
https://doi.org/10.1109/DFT50435.2020.9250865
RT T1
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
: T1
Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems
UL https://suche.suub.uni-bremen.de/peid=ieee-9250865&Exemplar=1&LAN=DE A1 Luza, Lucas Matana A1 Soderstrom, Daniel A1 Tsiligiannis, Georgios A1 Puchner, Helmut A1 Cazzaniga, Carlo A1 Sanchez, Ernesto A1 Bosio, Alberto A1 Dilillo, Luigi YR 2020 SN 2377-7966 K1 Neutrons K1 Radiation effects K1 Software K1 Resilience K1 Reliability K1 Approximate computing K1 Hardware SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/DFT50435.2020.9250865 DO https://doi.org/10.1109/DFT50435.2020.9250865 SF ELIB - SuUB Bremen
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