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Evaluating Data Encryption Effects on the Resilience of an ..:

, In: 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Cantoro, Riccardo ; Deligiannis, Nikolaos I. ; Reorda, Matteo Sonza.. - p. 1-4 , 2020
Link: https://doi.org/10.1109/DFT50435.2020.9250869