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Variation-Aware Test for Logic Interconnects using Neural N..:

, In: 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Sprenger, Alexander ; Sadeghi-Kohan, Somayeh ; Reimer, Jan Dennis. - p. 1-6 , 2020
Link: https://doi.org/10.1109/DFT50435.2020.9250922