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Shaving Retries with Sentinels for Fast Read over High-Dens..:

, In: 2020 53rd Annual IEEE/ACM International Symposium on Microarchitecture (MICRO),
Li, Qiao ; Ye, Min ; Cui, Yufei... - p. 483-495 , 2020
Link: https://doi.org/10.1109/MICRO50266.2020.00048