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Shaving Retries with Sentinels for Fast Read over High-Dens..:
, In:
2020 53rd Annual IEEE/ACM International Symposium on Microarchitecture (MICRO)
,
Li, Qiao
;
Ye, Min
;
Cui, Yufei
... - p. 483-495 , 2020
Link:
https://doi.org/10.1109/MICRO50266.2020.00048
RT T1
2020 53rd Annual IEEE/ACM International Symposium on Microarchitecture (MICRO)
: T1
Shaving Retries with Sentinels for Fast Read over High-Density 3D Flash
UL https://suche.suub.uni-bremen.de/peid=ieee-9251942&Exemplar=1&LAN=DE A1 Li, Qiao A1 Ye, Min A1 Cui, Yufei A1 Shi, Liang A1 Li, Xiaoqiang A1 Kuo, Tei-Wei A1 Xue, Chun Jason YR 2020 K1 3D NAND flash K1 read retry K1 reliability SP 483 OP 495 LK http://dx.doi.org/https://doi.org/10.1109/MICRO50266.2020.00048 DO https://doi.org/10.1109/MICRO50266.2020.00048 SF ELIB - SuUB Bremen
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