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MAF: A Framework for Modular Static Analysis of Higher-Orde..:

, In: 2020 IEEE 20th International Working Conference on Source Code Analysis and Manipulation (SCAM),
Van Es, Noah ; Van der Plas, Jens ; Stievenart, Quentin. - p. 37-42 , 2020
Link: https://doi.org/10.1109/SCAM51674.2020.00009