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Neural networks with simulated data for the faults detectio..:

, In: 2020 International Conference on Information Technology and Nanotechnology (ITNT),
Gareev, Albert ; Stadnik, Dmitriy ; Popelniuk, Ilia... - p. 1-4 , 2020
Link: https://doi.org/10.1109/ITNT49337.2020.9253325