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1 Ergebnisse
1
Statistical Multi-Faults Localization Strategy of Switch Op..:
, In:
IECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society
,
Jin, Ming
;
Deng, Fujin
;
Liu, Chengkai
... - p. 5302-5307 , 2020
Link:
https://doi.org/10.1109/IECON43393.2020.9254519
RT T1 <cTitle>IECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society</cTitle>: T1 <Title>Statistical Multi-Faults Localization Strategy of Switch Open-Circuit Fault for Modular Multilevel Converters Using Grubbs Criterion</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9254519&Exemplar=1&LAN=DE A1 Jin, Ming A1 Deng, Fujin A1 Liu, Chengkai A1 Yu, Qiang A1 Zhao, Jifeng A1 Wang, Qingsong YR 2020 SN 2577-1647 K1 Capacitors K1 Switches K1 Feature extraction K1 Mathematical model K1 Smoothing methods K1 Standards K1 Training data K1 Statistical K1 fault localization K1 modular multilevel converters K1 open-circuit fault K1 submodule SP 5302 OP 5307 LK http://dx.doi.org/https://doi.org/10.1109/IECON43393.2020.9254519 DO https://doi.org/10.1109/IECON43393.2020.9254519 SF ELIB - SuUB Bremen
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