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1 Ergebnisse
1
A Simple ANN-Based Diagnosis Method for Open-Switch Faults ..:
, In:
IECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society
,
Li, Zhan
;
Gao, Yuan
;
Ma, Hao
. - p. 2835-2839 , 2020
Link:
https://doi.org/10.1109/IECON43393.2020.9254607
RT T1
IECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society
: T1
A Simple ANN-Based Diagnosis Method for Open-Switch Faults in Power Converters
UL https://suche.suub.uni-bremen.de/peid=ieee-9254607&Exemplar=1&LAN=DE A1 Li, Zhan A1 Gao, Yuan A1 Ma, Hao A1 Zhang, Xin YR 2020 SN 2577-1647 K1 Artificial neural networks K1 Switches K1 Training K1 Circuit faults K1 Robustness K1 Neurons K1 Noise measurement K1 artificial neural network (ANN) K1 fault diagnosis K1 inverter K1 open-switch K1 raw data SP 2835 OP 2839 LK http://dx.doi.org/https://doi.org/10.1109/IECON43393.2020.9254607 DO https://doi.org/10.1109/IECON43393.2020.9254607 SF ELIB - SuUB Bremen
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